DocumentCode :
3372559
Title :
Verifying Current Conduction in a Low Energy Plasma
Author :
Buneo, J.D. ; Zirnheld, J.L. ; Burke, K.M. ; Licitra, M. ; Moore, H.L.
Author_Institution :
Energy Syst. Inst., Univ. at Buffalo, Buffalo, NY
fYear :
2005
fDate :
13-17 June 2005
Firstpage :
966
Lastpage :
969
Abstract :
A novel method of generating a low energy plasma utilizing the underlying characteristics of exploding wires was investigated. The plasma was formed by exciting the metallization on samples of polypropylene film with an impulse voltage of 2500 V. A concise method of simultaneously measuring the low energy plasma´s current, light intensity, and event duration in the infrared spectrum was performed. The afore mentioned quantities were measured using three independent methods in order to achieve the best representation of the low energy plasma. A streak imaging system was designed, and utilized to capture the time duration of the plasma as a representative image on a digital camera.Pin photodiodeswere used to measure the time duration of the infrared spectrum. Current was measured using an inductive probe. Time measurements taken from the photodiodes, streak imaging system, and current monitor all correlated to one another.
Keywords :
infrared spectra; photodiodes; plasma applications; current conduction verfication; digital camera; image representation; impulse voltage; infrared spectrum; low energy plasma; pin photodiodes; polypropylene film; streak imaging system; voltage 2500 V; Character generation; Current measurement; Energy measurement; Infrared spectra; Metallization; Optical imaging; Plasma measurements; Plasma properties; Time measurement; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 2005 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9189-6
Electronic_ISBN :
0-7803-9190-x
Type :
conf
DOI :
10.1109/PPC.2005.300455
Filename :
4084380
Link To Document :
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