Title :
Test Technology Technical Council (TTTC)
fDate :
April 27 2008-May 1 2008
Abstract :
Provides a listing of current committee members and society officers.
Keywords :
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3123-6
DOI :
10.1109/VTS.2008.87
