An effective broken scan chain diagnosis flow combining software and hardware solutions for systematic failures

Author

Goh, SH ; You, GF ; Yeoh, BL ; Chan, YH ; Tey, CK Chua ; Yap, CP ; Lim, TY ; Fei, T. ; Herrmann, Thomas ; Ho, HW ; He, R.

Author_Institution

Technol. Dev., GLOBALFOUNDRIES, Singapore, Singapore

fYear

2012

fDate

2-6 July 2012

Firstpage

1

Lastpage

5

Abstract

Conventional software scan diagnosis using Electronic Design Automation (EDA) tools and hardware diagnosis using frequency mapping technique, are established methodologies for broken scan chains fault isolation. This work proposes a diagnostic workflow that integrates both methodologies to enhance accuracy and reduce turnaround time for debug. Experimental results are presented to demonstrate the effectiveness of this workflow for systematic fail dies analysis.

Keywords

design for testability; failure analysis; system recovery; broken scan chain fault isolation; diagnostic workflow; electronic design automation tool; frequency mapping technique; hardware diagnosis; hardware solution; scan chain diagnosis flow; software scan diagnosis; software solution; systematic fail dies analysis; systematic failures; Failure analysis; Hardware; Laser beams; Scanning electron microscopy; Software; Systematics;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the

Conference_Location

Singapore

ISSN

1946-1542

Print_ISBN

978-1-4673-0980-6

Type

conf

DOI

10.1109/IPFA.2012.6306256

Filename

6306256