Title :
An effective broken scan chain diagnosis flow combining software and hardware solutions for systematic failures
Author :
Goh, SH ; You, GF ; Yeoh, BL ; Chan, YH ; Tey, CK Chua ; Yap, CP ; Lim, TY ; Fei, T. ; Herrmann, Thomas ; Ho, HW ; He, R.
Author_Institution :
Technol. Dev., GLOBALFOUNDRIES, Singapore, Singapore
Abstract :
Conventional software scan diagnosis using Electronic Design Automation (EDA) tools and hardware diagnosis using frequency mapping technique, are established methodologies for broken scan chains fault isolation. This work proposes a diagnostic workflow that integrates both methodologies to enhance accuracy and reduce turnaround time for debug. Experimental results are presented to demonstrate the effectiveness of this workflow for systematic fail dies analysis.
Keywords :
design for testability; failure analysis; system recovery; broken scan chain fault isolation; diagnostic workflow; electronic design automation tool; frequency mapping technique; hardware diagnosis; hardware solution; scan chain diagnosis flow; software scan diagnosis; software solution; systematic fail dies analysis; systematic failures; Failure analysis; Hardware; Laser beams; Scanning electron microscopy; Software; Systematics;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-0980-6
DOI :
10.1109/IPFA.2012.6306256
