• DocumentCode
    3372675
  • Title

    Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

  • Author

    Garg, Ritesh ; Putman, Richard ; Touba, Nur A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
  • fYear
    2008
  • fDate
    April 27 2008-May 1 2008
  • Firstpage
    35
  • Lastpage
    42
  • Abstract
    Recently, an X-canceling MISR methodology was proposed in Touba (2007) which was based on providing very high probabilistic error coverage by canceling out X´s in MISR signatures. This paper investigates a new methodology for using the X-canceling MISR architecture based on deterministically observing scan cells. The two main advantages of the proposed approach are (1) it can provide a higher amount of compaction, and (2) it is effective for larger percentages of X´s in the output response. Also, this paper investigates a hybrid approach that combines X-masking with an X-canceling MISR. Experimental results indicate that significant amounts of output compression can be achieved with no loss of fault coverage.
  • Keywords
    integrated circuit testing; probability; X-canceling MISR methodology; deterministic observation; fault coverage; probabilistic error coverage; Automatic test pattern generation; Automatic testing; Built-in self-test; Compaction; Design for testability; Fault detection; Hardware; Logic testing; Test pattern generators; Very large scale integration; Gaussian Elimination; Linear Compression; Response Compaction; X-tolerant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3123-6
  • Type

    conf

  • DOI
    10.1109/VTS.2008.42
  • Filename
    4511693