Title :
Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation
Author :
Garg, Ritesh ; Putman, Richard ; Touba, Nur A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
fDate :
April 27 2008-May 1 2008
Abstract :
Recently, an X-canceling MISR methodology was proposed in Touba (2007) which was based on providing very high probabilistic error coverage by canceling out X´s in MISR signatures. This paper investigates a new methodology for using the X-canceling MISR architecture based on deterministically observing scan cells. The two main advantages of the proposed approach are (1) it can provide a higher amount of compaction, and (2) it is effective for larger percentages of X´s in the output response. Also, this paper investigates a hybrid approach that combines X-masking with an X-canceling MISR. Experimental results indicate that significant amounts of output compression can be achieved with no loss of fault coverage.
Keywords :
integrated circuit testing; probability; X-canceling MISR methodology; deterministic observation; fault coverage; probabilistic error coverage; Automatic test pattern generation; Automatic testing; Built-in self-test; Compaction; Design for testability; Fault detection; Hardware; Logic testing; Test pattern generators; Very large scale integration; Gaussian Elimination; Linear Compression; Response Compaction; X-tolerant;
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3123-6
DOI :
10.1109/VTS.2008.42