DocumentCode
3372675
Title
Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation
Author
Garg, Ritesh ; Putman, Richard ; Touba, Nur A.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
35
Lastpage
42
Abstract
Recently, an X-canceling MISR methodology was proposed in Touba (2007) which was based on providing very high probabilistic error coverage by canceling out X´s in MISR signatures. This paper investigates a new methodology for using the X-canceling MISR architecture based on deterministically observing scan cells. The two main advantages of the proposed approach are (1) it can provide a higher amount of compaction, and (2) it is effective for larger percentages of X´s in the output response. Also, this paper investigates a hybrid approach that combines X-masking with an X-canceling MISR. Experimental results indicate that significant amounts of output compression can be achieved with no loss of fault coverage.
Keywords
integrated circuit testing; probability; X-canceling MISR methodology; deterministic observation; fault coverage; probabilistic error coverage; Automatic test pattern generation; Automatic testing; Built-in self-test; Compaction; Design for testability; Fault detection; Hardware; Logic testing; Test pattern generators; Very large scale integration; Gaussian Elimination; Linear Compression; Response Compaction; X-tolerant;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.42
Filename
4511693
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