DocumentCode :
3372703
Title :
Characterization of the worst-case current waveform excitations in general RLC-model power grid analysis
Author :
Evmorfopoulos, Nestor ; Rammou, Maria-Aikaterini ; Stamoulis, George ; Moondanos, John
Author_Institution :
Dept. of Comput. & Commun. Eng., Univ. of Thessaly, Volos, Greece
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
824
Lastpage :
830
Abstract :
Validating the robustness of power distribution in modern IC design is a crucial but very difficult problem, due to the vast number of possible working modes and the high operating frequencies which necessitate the modeling of power grid as a general RLC network. In this paper we provide a characterization of the worst-case current waveform excitations that produce the maximum voltage drop among all possible working modes of the IC. In addition, we give a practical methodology to estimate these worst-case excitations on the basis of a sample of the excitation space acquired via plain circuit simulation. In the course of characterizing the worst-case excitations we also establish that the voltage drop function for RLC grid models has nonnegative coefficients, which has been an open problem so far.
Keywords :
RLC circuits; integrated circuit design; integrated circuit modelling; excitation space; general RLC network; general RLC-model power grid analysis; high operating frequencies; maximum voltage drop; modern IC design; nonnegative coefficients; plain circuit simulation; power distribution; voltage drop function; working modes; worst-case current waveform excitations; Integrated circuit modeling; Manganese; Power grids; RLC circuits; Silicon; Symmetric matrices; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-8193-4
Type :
conf
DOI :
10.1109/ICCAD.2010.5653921
Filename :
5653921
Link To Document :
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