Title :
A referenceless all-digital fast frequency acquisition full-rate CDR circuit for USB 2.0 in 65nm CMOS technology
Author :
Chung, Ching-Che ; Dai, Wei-Cheng
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., Min-Hsiung, Taiwan
Abstract :
An all-digital fast frequency acquisition full-rate clock and data recovery (CDR) circuit for USB 2.0 applications without a reference clock is presented in this paper. The proposed digitally controlled oscillator (DCO) with an embedded time-to-digital converter (TDC) can recover the frequency of the synchronous data pattern in a very short time. In addition, the whole frequency acquisition can be finished within 31 cycles. A dual mode phase and frequency detector (PFD) is proposed to perform phase and frequency tracking with random data pattern to maintain the frequency and phase of the recovery clock. The proposed CDR circuit can operate at 480MHz for the USB 2.0 high-speed mode. The proposed CDR circuit can tolerance input data jitter up to 150ps with the bit error rate less than 10-12. The proposed CDR circuit is implemented in a standard process 65nm CMOS process, the core area is 150nm × 150nm, and the power consumption is 1.75mW (@480MHz).
Keywords :
CMOS integrated circuits; clock and data recovery circuits; clocks; digital phase locked loops; error statistics; jitter; oscillators; CMOS technology; USB 2.0 application; bit error rate; clock and data recovery circuit; data jitter; digitally controlled oscillator; dual mode phase and frequency detector; frequency 480 MHz; frequency acquisition; power 1.75 mW; random data pattern; referenceless all-digital fast frequency acquisition full-rate CDR circuit; size 65 nm; synchronous data pattern; time 150 ps; time-to-digital converter; Clocks; Delay lines; Frequency control; Frequency synchronization; Phase frequency detector; Synchronization; Universal Serial Bus; clock and data recovery; clocks; digital phase locked loops; jitter; oscillator; synchronization;
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-8500-0
DOI :
10.1109/VDAT.2011.5783614