DocumentCode :
3372897
Title :
Image recognition by learned linear subspace of combined bag-of-features and low-level features
Author :
Han, Xian-Hua ; Chen, Yen-wei ; Ruan, Xiang
Author_Institution :
Coll. of Inf. Sci. & Eng., Ritsumeikan Univ., Kusatsu, Japan
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
1049
Lastpage :
1052
Abstract :
Image category recognition is important to access visual information on the level of objects and scene types. This paper combines different feature representations of images and learn a compact subspace of different features for the automatic recognition of object and scene classes. Compact visual-words and low-level-features object class subspaces are automatically learned from a set of training images by a Regularized Linear Discriminant analysis (RLDA) algorithm, and the extracted RLDA-domain features are used for Support Vector Machine (SVM) classifier. The main contribution of this paper is two folds: i) Different features (bag-of-features and low-level features)is fused for image representation. ii) The compact feature subspaces (low-dimension features) of different features are learned for rendering to SVM classifier, which is computationally efficient for image category. High classification accuracy is demonstrated on object recognition database (Caltech). We confirm that the proposed strategy cam improve accuracy rate compared with state-of-the-art methods for object recognition databases.
Keywords :
feature extraction; image recognition; image representation; object recognition; support vector machines; automatic recognition; combined bag-of-features; image recognition; image representation; learned linear subspace; low-level features; object recognition databases; regularized linear discriminant analysis; rendering; support vector machine classifier; training images; Feature extraction; Histograms; Image color analysis; Object recognition; Shape; Support vector machines; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653931
Filename :
5653931
Link To Document :
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