Title : 
A Time-Domain Method for Pseudo-Spectral Characterization
         
        
            Author : 
Mishra, Apurva ; Soma, Mani
         
        
            Author_Institution : 
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
         
        
        
            fDate : 
April 27 2008-May 1 2008
         
        
        
        
            Abstract : 
We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an No-size spectrum, this enables a reduction of computational complexity from No In No multiply-accumulates (using an FFT) to No accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.
         
        
            Keywords : 
mixed analogue-digital integrated circuits; time-domain analysis; FFT method; chirp stimulus; pseudo-spectral characterization; time-domain method; transfer function; Built-in self-test; Circuit faults; Circuit testing; Computational complexity; Computational modeling; Frequency domain analysis; Radio frequency; Spectral analysis; Time domain analysis; Transfer functions; analog test; bist; fft; mixed-signal test;
         
        
        
        
            Conference_Titel : 
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
         
        
            Conference_Location : 
San Diego, CA
         
        
        
            Print_ISBN : 
978-0-7695-3123-6
         
        
        
            DOI : 
10.1109/VTS.2008.50