DocumentCode :
3373348
Title :
A New Method for Protection of Anchors in Releasing Microstructure by using XeF2 Etching Process
Author :
Fei, Feng ; Guangli, Yang ; Bin, Xiong ; Yuelin, Wang
Author_Institution :
Chinese Acad. of Sci., Shanghai
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
559
Lastpage :
562
Abstract :
This paper presents a protection technology of anchors to use xenon difluoride etching process to release micro structure in Micro-Electro-Mechanical Systems processing. This technology is based on deep reactive ion etching and two-time thermal oxidation technology. Firstly, the trenches around the anchors are formed by using deep reactive ion etching. Secondly, the trenches are filled with thermal silicon dioxide that is hardly etched by xenon difluoride. Robust silicon anchors with protection layer silicon dioxide have been fabricated. Then, 100times100 suspended micro structure array, in which each element consists of two anchors and a micromirror supported by two beams, has successfully been fabricated by using this technology.
Keywords :
micromechanical devices; oxidation; sputter etching; xenon compounds; XeF2; anchor protection; deep reactive ion etching; micro structure array; microelectromechanical systems; thermal oxidation; Etching; Fabrication; Microelectromechanical systems; Microstructure; Process design; Protection; Robustness; Silicon compounds; Transducers; Xenon; Micro-Electro-Mechanical Systems; Protection of anchors; Suspended microstructure array; Xenon difluoride etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300191
Filename :
4300191
Link To Document :
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