• DocumentCode
    3373348
  • Title

    A New Method for Protection of Anchors in Releasing Microstructure by using XeF2 Etching Process

  • Author

    Fei, Feng ; Guangli, Yang ; Bin, Xiong ; Yuelin, Wang

  • Author_Institution
    Chinese Acad. of Sci., Shanghai
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    559
  • Lastpage
    562
  • Abstract
    This paper presents a protection technology of anchors to use xenon difluoride etching process to release micro structure in Micro-Electro-Mechanical Systems processing. This technology is based on deep reactive ion etching and two-time thermal oxidation technology. Firstly, the trenches around the anchors are formed by using deep reactive ion etching. Secondly, the trenches are filled with thermal silicon dioxide that is hardly etched by xenon difluoride. Robust silicon anchors with protection layer silicon dioxide have been fabricated. Then, 100times100 suspended micro structure array, in which each element consists of two anchors and a micromirror supported by two beams, has successfully been fabricated by using this technology.
  • Keywords
    micromechanical devices; oxidation; sputter etching; xenon compounds; XeF2; anchor protection; deep reactive ion etching; micro structure array; microelectromechanical systems; thermal oxidation; Etching; Fabrication; Microelectromechanical systems; Microstructure; Process design; Protection; Robustness; Silicon compounds; Transducers; Xenon; Micro-Electro-Mechanical Systems; Protection of anchors; Suspended microstructure array; Xenon difluoride etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300191
  • Filename
    4300191