Title :
Probabilistic bounded relative error for rare event simulation learning techniques
Author :
Tuffin, Bruno ; Ridder, A.
Author_Institution :
Inria Rennes Bretagne Atlantique, Campus Univ. de Beaulieu, Rennes, France
Abstract :
In rare event simulation, we look for estimators such that the relative accuracy of the output is “controlled” when the rarity is getting more and more critical. Different robustness properties of estimators have been defined in the literature. However, these properties are not adapted to estimators coming from a parametric family for which the optimal parameter is random due to a learning algorithm. These estimators have random accuracy. For this reason, we motivate in this paper the need to define probabilistic robustness properties. We especially focus on the so-called probabilistic bounded relative error property. We additionally provide sufficient conditions, both in general and Markov settings, to satisfy such a property, and hope that it will foster discussions and new works in the area.
Keywords :
Markov processes; learning (artificial intelligence); probability; random processes; simulation; Markov setting; learning algorithm; optimal parameter; output relative accuracy; probabilistic bounded relative error property; probabilistic robustness property; random accuracy; rare event simulation learning technique; sufficient condition; Accuracy; Adaptation models; Estimation; Minimization; Probabilistic logic; Q measurement; Robustness;
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location :
Berlin
Print_ISBN :
978-1-4673-4779-2
Electronic_ISBN :
0891-7736
DOI :
10.1109/WSC.2012.6465041