DocumentCode :
3373568
Title :
Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear :
2008
fDate :
April 27 2008-May 1 2008
Firstpage :
317
Lastpage :
322
Abstract :
Functional operation of a synchronous sequential circuit is defined to start after the circuit is initialized to a known state, typically by a synchronizing sequence. The states that the circuit can visit after it is synchronized are called reachable states, and functional operation consists of state-transitions between reachable states. We expand the definition of functional operation to include all the state-transitions that may be traversed during the application of the synchronizing sequence. This adds certain state-transitions that involve unreachable states to the definition of functional operation. Expanding the definition of functional operation is justified by the fact that the circuit needs to be designed for correct operation during the synchronization process. It is advantageous when functional broadside tests are used to avoid over- testing. We study the effect of the expanded definition on the coverage of transition faults.
Keywords :
circuit testing; sequential circuits; functional broadside tests; functional operation conditions; synchronous sequential circuit; Circuit faults; Circuit testing; Cities and towns; Fault diagnosis; Hardware; Sequential circuits; Very large scale integration; full-scan circuits; functional broadside tests; reachable states; test generation; transition faults.;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3123-6
Type :
conf
DOI :
10.1109/VTS.2008.11
Filename :
4511743
Link To Document :
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