DocumentCode :
3373607
Title :
High Temperature I/sub DDQ/ Testing for Detection of Sodium and Potassium
Author :
Sabin, Edwin
fYear :
1996
fDate :
April 30 1996-May 2 1996
Firstpage :
355
Keywords :
Atherosclerosis; BiCMOS integrated circuits; Contamination; Performance evaluation; Pollution measurement; Power measurement; Probes; Silicon; System testing; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
Type :
conf
DOI :
10.1109/RELPHY.1996.492142
Filename :
492142
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3373607
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