DocumentCode :
3373613
Title :
Low Complexity Testing Micromachines Revealing Size-Dependent Mechanical Properties of Thin Al Films
Author :
Raskin, J.P. ; Fabrègue, D. ; André, N. ; Coulombier, M. ; Pardoen, T.
Author_Institution :
Res. Center in Micro & Nanoscopic Mater. & Electron. Devices, Louvain-la-Neuve
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
619
Lastpage :
622
Abstract :
The mechanical properties measurement of materials with submicron dimensions is extremely challenging, from the preparation and manipulation of specimens, to the application of small loads and extraction of accurate stresses and strains. Here, we describe a novel, versatile concept of micro and nano- machines to test films or beams with characteristic dimensions ranging between 10 nm to 1 mum, allowing multiple loading configurations and geometries. This testing method has been applied to thin, pure aluminium films. The yield strength linearly increases with the inverse of the film thickness, reaching 625 MPa for 150 nm thickness which is 10 times larger than for macroscopic samples.
Keywords :
aluminium; mechanical testing; micromechanical devices; nanostructured materials; thin films; yield strength; aluminium films; loading configurations; low complexity testing micromachines; nanomachines; submicron dimensions; thin Al films; yield strength; Actuators; Capacitive sensors; Computational modeling; Deformable models; Materials testing; Mechanical factors; Mechanical variables measurement; Micromechanical devices; Nanostructured materials; Plastic films; MEMS; Mechanical properties testing; Plastic deformation; Thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0841-5
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300206
Filename :
4300206
Link To Document :
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