DocumentCode

3373621

Title

IP Session 10C: Testing for Complex Failure Mechanisms and Process Variations of Memories

fYear

2008

fDate

April 27 2008-May 1 2008

Firstpage

336

Lastpage

336

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2008. VTS 2008. 26th IEEE

Conference_Location

San Diego, CA, USA

ISSN

1093-0167

Print_ISBN

978-0-7695-3123-6

Type

conf

DOI

10.1109/VTS.2008.78

Filename

4511746