DocumentCode :
3373646
Title :
Using an artificial intelligence approach to build an automated program understanding/fault localization tool
Author :
Burnstein, Ilene ; Saner, Floyd ; Limpiyakorn, Yachai
Author_Institution :
Dept. of Comput. Sci., Illinois Inst. of Technol., Chicago, IL, USA
fYear :
1999
fDate :
1999
Firstpage :
69
Lastpage :
76
Abstract :
Artificial intelligence techniques and architectures have played a large role in the design of a blackboard-based program understanding/fault localization tool we have been developing. We focus on a system knowledge source called the plan processor which will have artificial intelligence support for two of its major tasks. One task is to retrieve a set of program plans from a plan library using indices called signatures. To make this retrieval task more effective we propose using a genetic algorithm. We also describe a fuzzy reasoning component which supports the plan processor with a second task; ranking the retrieved plans in order of similarity to the target code. The most similar plan is then used for the complex plan/code matching required for automated program understanding. Our approach may eliminate the need for exhaustive plan library searches, and could lead to automated program understanders that scale up for use on software systems from a variety of problem domains
Keywords :
blackboard architecture; fuzzy logic; genetic algorithms; inference mechanisms; planning (artificial intelligence); program debugging; reverse engineering; uncertainty handling; artificial intelligence; blackboard-based tool; fault localization tool; fuzzy reasoning; genetic algorithm; plan library; plan processor; program understanding; system knowledge source; Artificial intelligence; Computer architecture; Computer science; Genetic algorithms; Knowledge engineering; Programming profession; Software libraries; Software maintenance; Software systems; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools with Artificial Intelligence, 1999. Proceedings. 11th IEEE International Conference on
Conference_Location :
Chicago, IL
ISSN :
1082-3409
Print_ISBN :
0-7695-0456-6
Type :
conf
DOI :
10.1109/TAI.1999.809768
Filename :
809768
Link To Document :
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