Title :
GaN-based technology for MQW modulating retro-reflectors operating in the visible and ultraviolet spectral ranges
Author :
Rivera, C. ; Cabrero, J.F. ; Munuera, P. ; Aragón, F.
Author_Institution :
R&D Dept., Ing. y Servicios Aeroesp., S.A., Madrid, Spain
Abstract :
Calculations based on the k·p perturbation approach have been used to study the properties of GaN-based electroabsorption modulators. The results indicate that optical transitions are dominated by the effect of piezoelectrically-induced electric fields. The measured extinction ratio of non-optimized devices is higher than 3 and 2.5 for modulators operating around 475 nm and 400 nm, respectively. In addition to applied voltage, carrier-induced screening seems an efficient method to drive the modulation.
Keywords :
III-V semiconductors; electro-optical modulation; electroabsorption; extinction coefficients; gallium compounds; integrated optics; retroreflectors; semiconductor quantum wells; ultraviolet spectra; visible spectra; wide band gap semiconductors; GaN; MQW modulating retroreflectors; carrier-induced screening; electroabsorption modulators; extinction ratio; k·p perturbation approach; multiple quantum well; nonoptimized devices; optical transitions; piezoelectrically-induced electric fields; ultraviolet spectra; visible spectra; Absorption; Electric fields; Gallium nitride; Optical modulation; Optical polarization; Quantum well devices; GaN; electro-optical modulators; modulating retro-reflectors; multiple quantum wells;
Conference_Titel :
Space Optical Systems and Applications (ICSOS), 2011 International Conference on
Conference_Location :
Santa Monica, CA
Print_ISBN :
978-1-4244-9686-0
DOI :
10.1109/ICSOS.2011.5783676