Title :
Large High Energy Density Pulse Discharge Capacitor Characterization
Author :
MacDougall, Fred ; Ennis, Joel ; Yang, Xiao Hui ; Seal, Ken ; Phatak, Sanjay ; Spinks, Brian ; Keller, Nathan ; Naruo, Chip ; Jow, T. Richard
Author_Institution :
Gen. Atomics Energy Products, Gen. Atomics Electron. Syst., Inc., San Diego, CA
Abstract :
The energy density of film capacitors continues to increase. This paper discusses the performance issues of limited life pulsed discharge capacitors operating at better than 2 J/cc (2 MJ/m3) in the 5 kV to 20 kV range. Self-healing metallized electrodes have been utilized in these designs to provide graceful aging at electric fields greater than 500 MV/m. A variety of polymer films have been evaluated for use in these capacitors. The pulse rise times where the capacitors find application are in the range of microseconds to milliseconds. Life tests have been performed with the goal of achieving at least 1000 charge/discharge cycles at maximum energy density. Failure modes in normal charge/discharge pulse service, and short- circuit fault conditions have been evaluated. Design modifications to increase life and energy density were made based on those analyses. Capacitors delivering greater than 100 kJ above 2 J/cc have been built, tested, and shipped.
Keywords :
electron device testing; life testing; polymer films; thin film capacitors; aging; energy density; failure modes; film capacitors; life tests; polymer films; pulse discharge capacitor; pulse rise times; self-healing metallized electrodes; voltage 5 kV to 20 kV; Aging; Capacitors; Circuit faults; Circuit testing; Electrodes; Life testing; Metallization; Performance evaluation; Polymer films; Pulse circuits;
Conference_Titel :
Pulsed Power Conference, 2005 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9189-6
Electronic_ISBN :
0-7803-9190-x
DOI :
10.1109/PPC.2005.300573