Title :
Precision of ADC Gain and Offset Error Estimation with the Standard Histogram Test
Author :
Alegria, F. Correa ; Serra, A. Cruz
Author_Institution :
Instituto de Telecomunicacoes/Instituto Superior Tecnico, Tech. Univ. of Lisbon, Lisboa
Abstract :
Extensive dynamic testing of Analog to Digital Converters is often carried out using the Standard Histogram Test. With this test one can estimate the converter transfer function, including gain, offset error, integral and differential non-linearity. Since the Histogram Test is inherently a statistic test, the estimated parameters are random variables affected by bias and uncertainty. This paper verses specifically the precision of terminal based gain and offset error precision
Keywords :
analogue-digital conversion; dynamic testing; error analysis; statistical testing; transfer functions; ADC gain; analog to digital converters; converter transfer function; histogram test; offset error estimation; Analog-digital conversion; Error analysis; Frequency estimation; Histograms; Linearity; Telecommunication standards; Testing; Transfer functions; Uncertainty; Voltage; ADC; gain; histogram; offset error; precision; test;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604118
