Title :
A neural network approach to ECT data inversion for materials quality evaluation
Author :
Fiori, Simone ; Burrascano, Pietro ; Cardelli, Ermanno
Author_Institution :
Dept. of Ind. Eng., Perugia Univ., Italy
Abstract :
The aim of this paper is to present a novel NDT technique for detecting and estimating the location of a defect inside a conductive object by neural network based processing of eddy-current data. The electromagnetic interaction between the conductive specimen and the eddy-current probe is simulated by a 3D numerical technique, which reproduces the differential impedance profile seen on the specimen´s accessible surface, depending on the defect location; the obtained data are used to train a multilayer neural network which provides an analytical approximation of electromagnetic interaction phenomena; a maximum likelihood inversion technique is then proved to be effective in estimating the flaw location
Keywords :
eddy current testing; electromagnetic induction; neural nets; nondestructive testing; 3D numerical technique; ECT data inversion; NDT technique; analytical approximation; conductive object; differential impedance profile; eddy current data; electromagnetic interaction; electromagnetic interaction phenomena; materials quality evaluation; maximum likelihood inversion technique; multilayer neural network; neural network approach; Analytical models; Conducting materials; Electrical capacitance tomography; Electromagnetic analysis; Maximum likelihood detection; Multi-layer neural network; Neural networks; Object detection; Probes; Surface impedance;
Conference_Titel :
Neural Networks for Signal Processing XI, 2001. Proceedings of the 2001 IEEE Signal Processing Society Workshop
Conference_Location :
North Falmouth, MA
Print_ISBN :
0-7803-7196-8
DOI :
10.1109/NNSP.2001.943156