Title :
Low current application dedicated process characterization method
Author :
Rahajandraibe, W. ; Dufaza, C. ; Auvergne, D. ; Cialdella, B. ; Majoux, B. ; Chowdhury, V.
Author_Institution :
LIRMM, Univ. de Montpellier II, France
Abstract :
We present in this paper a new characterization method dedicated to an analog low consumption application design. A test structure, based on a bandgap reference voltage, that allows parameters extraction at the circuit operating point, is presented. This test structure is used to adjust the final SPICE parameters in order to calibrate the electrical measurement value of each component of the circuit on the chip. An improvement of the design is simulated, tested and validated on silicon.
Keywords :
SPICE; calibration; circuit testing; low-power electronics; reference circuits; SPICE parameter extraction; Si; bandgap reference voltage; calibration; electrical measurement; low-current analog circuit design; process characterization method; test structure; Circuit simulation; Circuit testing; Low voltage; Parameter extraction; Photonic band gap; Protocols; Resistors; SPICE; Temperature dependence; Temperature measurement;
Conference_Titel :
Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on
Print_ISBN :
0-7803-7464-9
DOI :
10.1109/ICMTS.2002.1193168
