Title :
Quantification of age-related changes in the elastic texture of the human aortic wall by directional fractal curve
Author :
Jiang, C.F. ; Avolio, A.P.
Author_Institution :
Dept. of Electron., Kaohsiung Polytech. Inst., Taiwan
fDate :
31 Oct-3 Nov 1996
Abstract :
A new fractal feature, the Directional Fractal Curve (DFC), defined over an are of 180° and composed of 90 fractal dimensions determined at intervals of arc of 2°, was developed to account for the anisotropic property of a fractal texture. The DFC of images with directional preference shows a periodic pattern; while the DFC of images with no definite directional preference tends to be a horizontal line. The DFC of the elastic texture exhibits a single peak and can be characterized by a sinusoidal function. The DFC was applied to examine an age-related structural change in the elastin network of the aortic wall exposed by scanning electron microcopy. Aortic samples were obtained from 44 human subjects with age range of 3 months to 103 years. Results show that the DFCs of these subjects decay significantly as age increases. This suggests that the elastin network may be characterized in terms of DFC which can be used to quantify structural modifications due to physiological changes such as ageing
Keywords :
biomechanics; elasticity; fractals; image texture; medical image processing; scanning electron microscopy; 0.25 to 103 y; SEM image analysis; age-related changes quantification; ageing; anisotropic property; aortic samples; blood vessel mechanical properties; directional preference; elastin network; human aortic wall elastic texture; human subjects; periodic pattern; physiological changes; sinusoidal function; structural modifications quantification; Aging; Aneurysm; Australia; Biomedical engineering; Biomedical imaging; Digital-to-frequency converters; Fractals; Humans; Pathogens; Scanning electron microscopy;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646507