DocumentCode :
3374439
Title :
An Electrical Particle Velocity Profiler for In-Channel Clogging Detection and Flow Pattern Characterization
Author :
Kim, Tae Yoon ; Cho, Young-Ho
Author_Institution :
Korea Adv. Inst. of Sci. & Technol., Daejeon
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
775
Lastpage :
778
Abstract :
We present an electrical particle velocity profiler capable to detect in-channel clogging and flow pattern of the particles flowing in microfluidic devices. We measure both the particle position and velocity from the voltage signals generated by the particles passing across sensing electrodes, from which we finally obtain the velocity profile of the particles in channel flow. In the experimental study, the particle velocity profile is measured with the uncertainty of 5.44%, which is equivalent to the uncertainty of 5% in the previous optical method. We also experimentally verify the capability of the present method for the in-channel clogging detection. Compared to the previous optical methods, the present electrical particle velocity profiler offers the simpler structure, the cheaper cost, and the higher integrability to integrated bio fluidic systems.
Keywords :
microfluidics; particle velocity analysis; velocimeters; electrical particle velocity profiler; flow pattern characterization; in-channel clogging detection; microfluidic devices; Biomedical optical imaging; Electrodes; Measurement uncertainty; Microfluidics; Optical sensors; Particle measurements; Position measurement; Signal generators; Velocity measurement; Voltage; Particle velocity profiler; in-channel clogging detection; particle flow pattern characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300245
Filename :
4300245
Link To Document :
بازگشت