DocumentCode
3374604
Title
On the sufficiency of limited testing for knowledge based systems
Author
Menzies, T. ; Cukic, Bojan
Author_Institution
NASA, Fairmont, WV, USA
fYear
1999
fDate
1999
Firstpage
431
Lastpage
440
Abstract
Knowledge-based engineering and computational intelligence are expected to become core technologies in the design and manufacturing for the next generation of space exploration missions. Yet, if one is concerned with the reliability of knowledge based systems, studies indicate significant disagreement regarding the amount of testing needed for system assessment. The sizes of standard black-box test suites are impracticably large since the black-box approach neglects the internal structure of knowledge-based systems. On the contrary, practical results repeatedly indicate that only a few tests are needed to sample the range of behaviors of a knowledge-based program. In this paper, we model testing as a search process over the internal state space of the knowledge-based system. When comparing different test suites, the test suite that examines larger portion of the state space is considered more complete. Our goal is to investigate the trade-off between the completeness criterion and the size of test suites. The results of testing experiment on tens of thousands of mutants of real-world knowledge based systems indicate that a very limited gain in completeness can be achieved through prolonged testing. The use of simple (or random) search strategies for testing appears to be as powerful as testing by more thorough search algorithms
Keywords
knowledge based systems; program testing; search problems; computational intelligence; knowledge based systems; knowledge-based engineering; limited testing; search process; test suite; Computational intelligence; Design engineering; Knowledge based systems; Knowledge engineering; Manufacturing; Reliability engineering; Space technology; State-space methods; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Tools with Artificial Intelligence, 1999. Proceedings. 11th IEEE International Conference on
Conference_Location
Chicago, IL
ISSN
1082-3409
Print_ISBN
0-7695-0456-6
Type
conf
DOI
10.1109/TAI.1999.809838
Filename
809838
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