DocumentCode
3374649
Title
A performance driven generator for efficient testable conditional-sum-adders
Author
Becker, B. ; Molitor, P.
Author_Institution
Dept. of Comp. Sci., Johann Wolfgang Goethe-Univ., Frankfurt, Germany
fYear
1992
fDate
7-10 Sep 1992
Firstpage
370
Lastpage
375
Abstract
The authors present a performance driven generator for integer adders which is parameterized in n , the operands´ bit length, t n, the delay of the addition, and FM, the (cell based static) fault model. FM may in particular be chosen as the classical stuck-at fault model or the cellular fault model. The output of the generator is an area-minimal n -bit adder of the conditional-sum type with delay ⩽t n (if such a circuit exists at all). The number of test vectors constructed is bounded by O (n 2). The running time of the generator itself is about c ×n 2× t n where c is a small constant
Keywords
adders; delays; design for testability; fault location; logic testing; cell based static fault model; cellular fault model; conditional-sum type; delay; efficient testable conditional-sum-adders; performance driven generator; stuck-at fault model; test vectors; Added delay; Adders; Circuit faults; Circuit testing; Delay effects; Delay estimation; Dynamic programming; Libraries; Upper bound; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location
Hamburg
Print_ISBN
0-8186-2780-8
Type
conf
DOI
10.1109/EURDAC.1992.246217
Filename
246217
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