• DocumentCode
    3374649
  • Title

    A performance driven generator for efficient testable conditional-sum-adders

  • Author

    Becker, B. ; Molitor, P.

  • Author_Institution
    Dept. of Comp. Sci., Johann Wolfgang Goethe-Univ., Frankfurt, Germany
  • fYear
    1992
  • fDate
    7-10 Sep 1992
  • Firstpage
    370
  • Lastpage
    375
  • Abstract
    The authors present a performance driven generator for integer adders which is parameterized in n, the operands´ bit length, tn, the delay of the addition, and FM, the (cell based static) fault model. FM may in particular be chosen as the classical stuck-at fault model or the cellular fault model. The output of the generator is an area-minimal n-bit adder of the conditional-sum type with delay ⩽tn (if such a circuit exists at all). The number of test vectors constructed is bounded by O(n2). The running time of the generator itself is about c×n2× tn where c is a small constant
  • Keywords
    adders; delays; design for testability; fault location; logic testing; cell based static fault model; cellular fault model; conditional-sum type; delay; efficient testable conditional-sum-adders; performance driven generator; stuck-at fault model; test vectors; Added delay; Adders; Circuit faults; Circuit testing; Delay effects; Delay estimation; Dynamic programming; Libraries; Upper bound; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-8186-2780-8
  • Type

    conf

  • DOI
    10.1109/EURDAC.1992.246217
  • Filename
    246217