DocumentCode :
3374828
Title :
Design for Bit Error Rate estimation of high speed serial links
Author :
Guin, Ujjwal ; Chiang, Chen-Huan
Author_Institution :
Dept. of ECE, Temple Univ., Philadelphia, PA, USA
fYear :
2011
fDate :
1-5 May 2011
Firstpage :
278
Lastpage :
283
Abstract :
High speed serial links, consisting of SerDes devices, require the Bit Error Rate (BER) to be at the level of 10-12 or lower. The excessive test time for comparing each captured bit for error detection in the traditional BER measurement and the costly instrumentation are major drawbacks for high volume production test of SerDes devices. In this paper, we propose a design for BER estimation methodology which includes a new BER estimation method, a simple BER test system which incorporates a novel design of time-to-digital converter (TDC).
Keywords :
error statistics; BER test system; SerDes devices; bit error rate estimation; error detection; high speed serial links; time-to-digital converter; Bit error rate; Clocks; Delay; Erbium; Estimation; Jitter; Mathematical model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
978-1-61284-657-6
Type :
conf
DOI :
10.1109/VTS.2011.5783734
Filename :
5783734
Link To Document :
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