Title :
Multi Domain Test: Novel test strategy to reduce the Cost of Test
Author :
Takahashi, Yasuhiro ; Maeda, Akinori
Author_Institution :
S&S Prof. Service, Verigy Japan K.K., Hachioji, Japan
Abstract :
The Multi-Domain-Test is the new test strategy to resolve problems and limitations of the Multi-Site-Test and the Concurrent-Test. By this novel test strategy, test time can be reduced down to 50% of the Single-Site-Test with almost the same amount of tester resources. Cost Of Test (COT) can be lower than the Multi-Site-Test that is well used at productions.
Keywords :
automatic test equipment; integrated circuit testing; COT; concurrent-test; cost-of-test; multidomain test; multisite-test; IP networks; Interference; Performance evaluation; Power supplies; Production; Sockets; System-on-a-chip; Concurrent Test Multi Site Test; Costs Of Test (COT); Multi Domain Test; Test System Configuration;
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
Print_ISBN :
978-1-61284-657-6
DOI :
10.1109/VTS.2011.5783738
