Title :
Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs
Author :
Lin, W.-A. ; Lee, C.-C. ; Huang, J.-L.
Author_Institution :
Grad. Inst. of Electron. Eng., Taiwan Univ., Taipei, Taiwan
Abstract :
Output variation testing of TFT-LCD source driver ICs is very expensive and time-consuming due to the large amount of analog output channels and levels to measure. This paper presents a low-cost on-scribe-line BIST technique for wafer-level source driver IC testing. Based on the BIST structure and the sigma-delta modulation principle, we propose a two-stage test flow and construct a generalized test cost function to find the optimal test setup parameters.
Keywords :
built-in self test; driver circuits; integrated circuit testing; liquid crystal displays; sigma-delta modulation; thin film transistors; BIST structure; TFT-LCD source driver IC; analog output channels; generalized test cost function; on-scribe-line BIST technique; optimal test setup parameters; output variation testing; sigma-delta modulation; two-stage test flow; wafer-level source driver IC testing; wafer-level testing; Accuracy; Built-in self-test; Clocks; Driver circuits; Integrated circuits; Voltage measurement; TFT-LCD; built-in self-testing; mixed-signal testing; sigma-delta modulation; source driver;
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
Print_ISBN :
978-1-61284-657-6
DOI :
10.1109/VTS.2011.5783740
