DocumentCode :
3374974
Title :
Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -
Author :
Okawara, Hideo
Author_Institution :
Verigy Japan, K.K., Tokyo, Japan
fYear :
2011
fDate :
1-5 May 2011
Firstpage :
322
Lastpage :
322
Abstract :
This is an embedded tutorial. It consists of two sections. The first section reviews several basic background topics for understanding the practical application examples presented in the second section. Most mixed signal tests employ the FFT-based processing. Firstly the relationship of the sampled waveform and the frequency spectrum is discussed by reviewing the DFT and IDFT equations. In the second section, there are three practical application examples presented. The first example is the trend removal. The second example reduces noise on small signals measured by a passive resistive probe in the TDR experiments. The third example demonstrates the planning procedure of wideband signal under-sampling.
Keywords :
discrete Fourier transforms; inverse transforms; mixed analogue-digital integrated circuits; signal denoising; signal sampling; AC-coupled measurement; DC offset drift; DFT equation; FFT-based signal processing; IDFT equation; IFFT method; TDR experiments; frequency spectrum; mixed signal test; noise reduction; passive resistive probe; sampled waveform; signal denoising; trend removal; wideband signal capturing; wideband signal under-sampling; Baseband; Equations; Frequency domain analysis; Guidelines; Noise; Noise measurement; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
978-1-61284-657-6
Type :
conf
DOI :
10.1109/VTS.2011.5783741
Filename :
5783741
Link To Document :
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