Title :
A transactional nested process management system
Author :
Chen, Qiming ; Dayal, Umesh
Author_Institution :
HP Labs., Palo Alto, CA, USA
fDate :
26 Feb-1 Mar 1996
Abstract :
Providing flexible transaction semantics and incorporating activities, data and agents are the key issues in workflow system development. Unfortunately, most of the commercial workflow systems lack the advanced features of transaction models, and an individual transaction model with specific emphasis lacks sufficient coverage for business process management. This report presents our solutions to the above problems in developing the Open Process Management System (OPMS) at HP Laboratories. OPMS is based on nested activity modeling with the following extensions and constraints: `in-process open nesting´ for extending closed/open nesting to accommodate applications that require improved process-wide concurrency without sacrificing top-level atomicity; `confined open´ as a constraint on both open and in-process open activities for avoiding the semantic inconsistencies in activity triggering and compensation; and `two-phase remedy´ as a generalized hierarchical approach for handling failures
Keywords :
business data processing; concurrency control; open systems; system recovery; transaction processing; Open Process Management System; activity triggering; business process management; closed/open nesting; compensation; confined open; coverage; failure handling; flexible transaction semantics; generalized hierarchical approach; in-process open activities; in-process open nesting; nested activity modeling; process-wide concurrency; semantic inconsistencies; top-level atomicity; transaction models; transactional nested process management system; two-phase remedy; workflow system development; Automatic control; Automation; Business; Concurrent computing; Control system synthesis; Data engineering; Laboratories; Pressing; Protection; Transaction databases;
Conference_Titel :
Data Engineering, 1996. Proceedings of the Twelfth International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-8186-7240-4
DOI :
10.1109/ICDE.1996.492207