DocumentCode
3375025
Title
A Low Cost Experimental Set-up to Characterize Piezoelectric Cantilever Bimorphs
Author
Andó, Bruno ; Graziani, Salvatore ; Giannone, Pietro
Author_Institution
Dipt. di Ingegneria Elettrica Elettronica e dei Sistemi, Catania Univ.
Volume
1
fYear
2005
fDate
16-19 May 2005
Firstpage
581
Lastpage
586
Abstract
Hysteresis is a common phenomenon in nonlinear systems. Piezoelectric bimorphs show hysteretic behavior, when operating as actuators. Tools producing the characterization of these devices are available, which use high cost set-up measuring deformations with resolutions in the order of 10-3 mum. In this paper, a new low cost experimental set-up for investigating the behavior of piezoelectric actuators is discussed, which uses coupled infrared detectors. The tool, providing deformation measurements with a resolution in the order of 10 mum, is intended to produce a rough estimation of the device behavior, which would be of interest for research and educational purposes. Low cost, easy reproducibility in research laboratories and educational laboratories, contact-less measurement strategy, inset calibration facility and suitable user interface are the main features of the tool developed. Notes on the uncertainty introduced by the tool when estimating the bimorph deformation are given. Moreover, a case study concerning the characterization of a piezoelectric bimorph actuator is discussed to illustrate the performances of the system developed in a real case
Keywords
cantilevers; deformation; hysteresis; infrared detectors; piezoelectric actuators; bimorph deformation; coupled infrared detectors; hysteresis behavior; nonlinear systems; piezoelectric actuators; piezoelectric cantilever bimorphs; Calibration; Capacitive sensors; Costs; Displacement measurement; Hysteresis; Infrared sensors; Laboratories; Piezoelectric actuators; Piezoelectric effect; Piezoelectric polarization; Piezoelectric bimorph; actuator; characterization; infrared sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location
Ottawa, Ont.
Print_ISBN
0-7803-8879-8
Type
conf
DOI
10.1109/IMTC.2005.1604183
Filename
1604183
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