• DocumentCode
    3375025
  • Title

    A Low Cost Experimental Set-up to Characterize Piezoelectric Cantilever Bimorphs

  • Author

    Andó, Bruno ; Graziani, Salvatore ; Giannone, Pietro

  • Author_Institution
    Dipt. di Ingegneria Elettrica Elettronica e dei Sistemi, Catania Univ.
  • Volume
    1
  • fYear
    2005
  • fDate
    16-19 May 2005
  • Firstpage
    581
  • Lastpage
    586
  • Abstract
    Hysteresis is a common phenomenon in nonlinear systems. Piezoelectric bimorphs show hysteretic behavior, when operating as actuators. Tools producing the characterization of these devices are available, which use high cost set-up measuring deformations with resolutions in the order of 10-3 mum. In this paper, a new low cost experimental set-up for investigating the behavior of piezoelectric actuators is discussed, which uses coupled infrared detectors. The tool, providing deformation measurements with a resolution in the order of 10 mum, is intended to produce a rough estimation of the device behavior, which would be of interest for research and educational purposes. Low cost, easy reproducibility in research laboratories and educational laboratories, contact-less measurement strategy, inset calibration facility and suitable user interface are the main features of the tool developed. Notes on the uncertainty introduced by the tool when estimating the bimorph deformation are given. Moreover, a case study concerning the characterization of a piezoelectric bimorph actuator is discussed to illustrate the performances of the system developed in a real case
  • Keywords
    cantilevers; deformation; hysteresis; infrared detectors; piezoelectric actuators; bimorph deformation; coupled infrared detectors; hysteresis behavior; nonlinear systems; piezoelectric actuators; piezoelectric cantilever bimorphs; Calibration; Capacitive sensors; Costs; Displacement measurement; Hysteresis; Infrared sensors; Laboratories; Piezoelectric actuators; Piezoelectric effect; Piezoelectric polarization; Piezoelectric bimorph; actuator; characterization; infrared sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604183
  • Filename
    1604183