DocumentCode
3375026
Title
Invited paper: Yin and Yang of embedded sensors for post-scaling-era
Author
Gattiker, Anne
Author_Institution
IBM Res. Austin, Austin, TX, USA
fYear
2011
fDate
1-5 May 2011
Firstpage
324
Lastpage
327
Abstract
As gains in integrated circuit power and performance achieved through scaling of feature sizes slows, system and circuit design must carry more of the burden for improvement. Aggressive design decreases guardbands, increasing the risk of circuit failure. This paper discusses the increasing need for embedded on-chip sensors to enable aggressive design and also to help counter the attendant increased risks.
Keywords
failure analysis; integrated circuit reliability; microprocessor chips; sensors; attendant increased risks; circuit failure; embedded on-chip sensors; embedded sensors; integrated circuit performance; integrated circuit power; Gold; Manufacturing; Microprocessors; Monitoring; Semiconductor device measurement; System-on-a-chip; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783743
Filename
5783743
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