DocumentCode
3375086
Title
Automation of measuring process of materials refractive indexes in the millimeter-submilimeter waves range by interferometric-turning method
Author
Andrushchak, Anatoliy S. ; Syrotynskiy, Oleg I. ; Andrushchak, Nazariy A.
Author_Institution
Lviv Polytech. Nat. Univ., Lviv
fYear
2008
fDate
2-4 Oct. 2008
Firstpage
48
Lastpage
49
Abstract
In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter-submilimeter waves was perfected by automation of measurement process. A new scheme was described and measurement error of refractive index was specified.
Keywords
Mach-Zehnder interferometers; millimetre wave measurement; refractive index measurement; submillimetre wave measurement; interferometric-turning method; materials refractive indexes; millimeter-submilimeter waves range; Anisotropic magnetoresistance; Automation; Crystals; Interference; Measurement errors; Mirrors; Optical refraction; Refractive index; Rotation measurement; Turning; interferometric-turning method; isotropic and anisotropic materials; millimeter and submilimetr waves; refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
THz Radiation: Basic Research and Applications, 2008. TERA 2008. International Workshop
Conference_Location
Alushta
Print_ISBN
978-1-4244-2686-7
Electronic_ISBN
978-1-4244-2687-4
Type
conf
DOI
10.1109/TERA.2008.4673816
Filename
4673816
Link To Document