DocumentCode
3375279
Title
Adaptive Self-Calibration Algorithm for Smart Sensors Linearization
Author
Pereira, J. M Dias ; Postolache, O. ; Girão, P. Silva
Author_Institution
Escola Superior de Tecnologia de Setubal, Inst. Politecnico de Setubal
Volume
1
fYear
2005
fDate
16-19 May 2005
Firstpage
648
Lastpage
652
Abstract
Calibration and linearization are two important topics that must always be considered to assure measurement system´s accuracy. Measurement errors, namely offset, gain and linearization errors, can be compensated as long as timely calibration routines are performed in the measurement system. Nowadays, with the advent of smart sensors, the new capabilities associated with microprocessor or microcontroller devices can support new and advanced calibration and self-calibration algorithms that contribute to increase measurement´s accuracy. In the present paper an adaptive self-calibration algorithm for smart sensors´ linearization is proposed which takes into consideration the probability density function of the measurement data in order to reduce the number of calibration points, and associated calibration time, for a required level of accuracy. The progressive polynomial interpolation method is considered in order to preserve the values of calibration coefficients, already evaluated for previous calibration points, without starting the algorithmic calculation of a new set of the calibration coefficients for each new additional calibration point. Some simulations and an experimental result, for a square root characteristic of a venturi type airflow transducer, will be presented in order to validate theoretical expectations
Keywords
calibration; intelligent sensors; linearisation techniques; measurement errors; adaptive self-calibration algorithm; airflow transducer; measurement errors; measurement system accuracy; microcontroller devices; microprocessor devices; polynomial interpolation method; probability density function; smart sensors linearization; Calibration; Density measurement; Gain measurement; Intelligent sensors; Measurement errors; Microcontrollers; Microprocessors; Performance evaluation; Performance gain; Probability density function; accuracy; calibration; linearization; smart sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location
Ottawa, Ont.
Print_ISBN
0-7803-8879-8
Type
conf
DOI
10.1109/IMTC.2005.1604197
Filename
1604197
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