• DocumentCode
    3375377
  • Title

    Special session: Multifaceted approaches for field reliability

  • Author

    Sato, Yuuki

  • Author_Institution
    Kyushu Inst. of Technol., Kitakyusyu, Japan
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    96
  • Lastpage
    96
  • Abstract
    The special session covers the following: programmability based approach to post-silicon debug and rectification; an EDA tool chain for soft-error tolerant VLSI design; accurate and efficient SoC field test for failure prediction.
  • Keywords
    VLSI; circuit CAD; integrated circuit design; integrated circuit reliability; integrated circuit testing; program debugging; system-on-chip; EDA tool chain; SoC field test; failure Prediction; field reliability; post-silicon debug; programmability based approach; rectification; soft-error test; soft-error tolerant VLSI design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783762
  • Filename
    5783762
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3375377