Title :
Special session: Multifaceted approaches for field reliability
Author_Institution :
Kyushu Inst. of Technol., Kitakyusyu, Japan
Abstract :
The special session covers the following: programmability based approach to post-silicon debug and rectification; an EDA tool chain for soft-error tolerant VLSI design; accurate and efficient SoC field test for failure prediction.
Keywords :
VLSI; circuit CAD; integrated circuit design; integrated circuit reliability; integrated circuit testing; program debugging; system-on-chip; EDA tool chain; SoC field test; failure Prediction; field reliability; post-silicon debug; programmability based approach; rectification; soft-error test; soft-error tolerant VLSI design;
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
Print_ISBN :
978-1-61284-657-6
DOI :
10.1109/VTS.2011.5783762
