Title : 
Simulated superior performances of semiconductor superjunction devices
         
        
            Author : 
Fujihira, Tatsuhiko ; Miyasaka, Yasushi
         
        
            Author_Institution : 
Fuji Electr. Co. Ltd., Matsumoto, Japan
         
        
        
        
        
        
            Abstract : 
The performances of majority- and minority-carrier semiconductor superjunction devices are examined and compared to that of standard devices in terms of forward current density, reverse leakage current, and switching charge. Based on two-dimensional simulations and theoretical calculations, it is shown that two orders of magnitude improvement in forward current density, an order of magnitude improvement in switching charge for majority-carrier superjunction devices, and an order of magnitude improvement in forward current density for minority-carrier superjunction devices are feasible when compared to standard devices
         
        
            Keywords : 
Schottky diodes; current density; leakage currents; minority carriers; p-n junctions; power MOSFET; power semiconductor diodes; power semiconductor switches; semiconductor device models; switching; 2D simulations; MOSFET; Schottky-barrier diode; forward current density; majority-carrier semiconductor superjunction devices; majority-carrier superjunction devices; minority-carrier semiconductor superjunction devices; minority-carrier superjunction devices; p-n junction diode; performance simulation; reverse leakage current; semiconductor superjunction devices; switching charge; Conducting materials; Current density; FETs; Leakage current; MOSFET circuits; P-n junctions; Power semiconductor switches; Production facilities; Semiconductor devices; Semiconductor materials;
         
        
        
        
            Conference_Titel : 
Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
         
        
            Conference_Location : 
Kyoto
         
        
        
            Print_ISBN : 
0-7803-4752-8
         
        
        
            DOI : 
10.1109/ISPSD.1998.702736