DocumentCode :
3375813
Title :
A quantitative measure of robustness for delay fault testing
Author :
Mao, Weiwei ; Ciletti, Michael D.
Author_Institution :
Ford Microelectronics Inc., Colorado Springs, CO, USA
fYear :
1992
fDate :
7-10 Sep 1992
Firstpage :
543
Lastpage :
549
Abstract :
A quantitative measure of robustness is introduced and used to evaluate the quality of a set of test pattern pairs when multiple delay faults are present in the circuit under test. It is shown that robust test patterns discussed in many previous papers are actually special cases of the robustness measure. The measure can be used to guide the selection of test pairs for delay fault testing, and thereby improve the quality of the set of test pairs used to detect delay faults
Keywords :
delays; integrated circuit testing; logic testing; multiple delay faults; quantitative measure; robustness; test pattern pairs; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Logic testing; Microelectronics; Robustness; Springs; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location :
Hamburg
Print_ISBN :
0-8186-2780-8
Type :
conf
DOI :
10.1109/EURDAC.1992.246318
Filename :
246318
Link To Document :
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