DocumentCode :
3375826
Title :
Excellent passivation structure of high efficiency multicrystalline silicon solar cells
Author :
Sun, Wen-Chin ; Chen, Chien-Hsun ; Huang, Chien-Rong ; Du, Chen-Hsun ; Wang, T.Y. ; Lan, Chung-Wen
Author_Institution :
Photovoltaics Technology Center Industrial Technology Research Institute, Hsinchu, Taiwan
fYear :
2008
fDate :
11-16 May 2008
Firstpage :
1
Lastpage :
4
Abstract :
The passivation effects for multicrystalline silicon solar cell with different configurations are investigated. Al2O3 and SiO2 films are used as the passivation layer in this work. They are prepared by atomic layer deposition and thermal oxidation, respectively. Using monolayer (Al2O3 or SiO2) as the passivation layer, the cell efficiency is 16.33% and 17.41%, respectively. The excellent passivation structure shows the drastic enhancement in cell efficiency of 19.09%. The quantum efficiency results show the improvement in the IR range, which explains the high energy conversion efficiency for the excellent structure.
Keywords :
Atomic layer deposition; Chemical technology; Furnaces; Passivation; Photovoltaic cells; Radiative recombination; Semiconductor films; Silicon; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2008.4922434
Filename :
4922434
Link To Document :
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