Title :
Modeling of simultaneous switching ground noise for BiCMOS drivers
Author :
Seeker, D.A. ; Prince, J.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
A model of simultaneous switching ground noise for the BiCMOS driver is presented. Level I SPICE-type MOSFET and Gummel-Poon BJT device models are used for the analysis. Immunity of the quiet BiCMOS driver to noise present at the ground and power connections is also investigated
Keywords :
BiCMOS integrated circuits; SPICE; circuit analysis computing; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; BiCMOS drivers; Gummel-Poon BJT device; Level I SPICE-type MOSFET; ground connections; power connections; semiconductor device models; simultaneous switching ground noise; BiCMOS integrated circuits; Circuit noise; Driver circuits; Electronics packaging; Integrated circuit noise; MOSFET circuits; Production; Semiconductor device noise; Switches; Threshold voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1995
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3034-X
DOI :
10.1109/EPEP.1995.524687
