• DocumentCode
    3375884
  • Title

    Author index

  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • Keywords
    Indexes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783787
  • Filename
    5783787