DocumentCode :
3375884
Title :
Author index
fYear :
2011
fDate :
1-5 May 2011
Firstpage :
1
Lastpage :
2
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
Keywords :
Indexes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
978-1-61284-657-6
Type :
conf
DOI :
10.1109/VTS.2011.5783787
Filename :
5783787
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3375884
