Title :
A generic software system for drift reliability optimization of VLSI circuits
Author :
Huang, Min ; Styblinski, M.A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A generic software system called GOSSIPDR (generic optimization system for statistical improvement of performance) to perform DR (drift reliability) analysis and optimization is presented. This system was developed based on new DR analysis and optimization methodologies. Several useful system features and functions are described. Applications in VLSI circuit design are given, in which degradations due to hot electron effects are considered
Keywords :
VLSI; circuit CAD; monolithic integrated circuits; reliability; GOSSIPDR; VLSI circuits; drift reliability optimization; generic software system; hot electron effects; Application software; Circuit synthesis; Degradation; Electrons; Integrated circuit reliability; Optimization methods; Packaging; Performance analysis; Software systems; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location :
Hamburg
Print_ISBN :
0-8186-2780-8
DOI :
10.1109/EURDAC.1992.246325
