Title : 
Modeling and Measurement of Microwave Emission and Backscattering from Bare Soil Surfaces
         
        
            Author : 
Saatchi, S. ; Wegmuller, U.
         
        
            Author_Institution : 
Jet Propulsion Laboratory California Institute of Technology
         
        
        
        
        
        
        
            Keywords : 
microwave backscattering, emissivity, soil moisture, surface rms height; Backscatter; Frequency; Microwave measurements; Microwave radiometry; Optical scattering; Optical surface waves; Rough surfaces; Soil measurements; Soil moisture; Surface roughness;
         
        
        
        
            Conference_Titel : 
Geoscience and Remote Sensing Symposium, 1992. IGARSS '92. International
         
        
            Conference_Location : 
Houston, TX, USA
         
        
            Print_ISBN : 
0-7803-0138-2
         
        
        
            DOI : 
10.1109/IGARSS.1992.578380