Title :
Modeling and Measurement of Microwave Emission and Backscattering from Bare Soil Surfaces
Author :
Saatchi, S. ; Wegmuller, U.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology
Keywords :
microwave backscattering, emissivity, soil moisture, surface rms height; Backscatter; Frequency; Microwave measurements; Microwave radiometry; Optical scattering; Optical surface waves; Rough surfaces; Soil measurements; Soil moisture; Surface roughness;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1992. IGARSS '92. International
Conference_Location :
Houston, TX, USA
Print_ISBN :
0-7803-0138-2
DOI :
10.1109/IGARSS.1992.578380