• DocumentCode
    3376661
  • Title

    Symbolic system level reliability analysis

  • Author

    Glaß, Michael ; Lukasiewycz, Martin ; Reimann, Felix ; Haubelt, Christian ; Teich, Jürgen

  • Author_Institution
    Univ. of Erlangen-Nuremberg, Erlangen, Germany
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    185
  • Lastpage
    189
  • Abstract
    More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderate-sized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems.
  • Keywords
    Monte Carlo methods; binary decision diagrams; computability; embedded systems; Monte Carlo simulation; SAT solver; binary decision diagram; electronic system level; embedded system; formal approach; symbolic system level reliability analysis; Accuracy; Analytical models; Boolean functions; Data structures; Embedded systems; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-8193-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.2010.5654134
  • Filename
    5654134