DocumentCode
3376661
Title
Symbolic system level reliability analysis
Author
Glaß, Michael ; Lukasiewycz, Martin ; Reimann, Felix ; Haubelt, Christian ; Teich, Jürgen
Author_Institution
Univ. of Erlangen-Nuremberg, Erlangen, Germany
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
185
Lastpage
189
Abstract
More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderate-sized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems.
Keywords
Monte Carlo methods; binary decision diagrams; computability; embedded systems; Monte Carlo simulation; SAT solver; binary decision diagram; electronic system level; embedded system; formal approach; symbolic system level reliability analysis; Accuracy; Analytical models; Boolean functions; Data structures; Embedded systems; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-8193-4
Type
conf
DOI
10.1109/ICCAD.2010.5654134
Filename
5654134
Link To Document