Title :
An Incremental Approach for Model-Based Test Suite Reduction Using Formal Concept Analysis
Author :
Ng, Pin ; Fung, Richard Y K
Author_Institution :
Hong Kong Community Coll., Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage.
Keywords :
finite state machines; formal verification; program testing; concept lattice properties; formal concept analysis; incremental approach; model-based test suite reduction; state machine model; transition set; Computer aided software engineering; Educational institutions; Embedded software; Lattices; Organizing; Research and development management; Software systems; Software testing; System testing; Virtual manufacturing;
Conference_Titel :
Ubiquitous Information Technologies & Applications, 2009. ICUT '09. Proceedings of the 4th International Conference on
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-5131-9
DOI :
10.1109/ICUT.2009.5405725
