A Simple and Time-effective Procedure for ADC INL Estimation

Author

Stefani, F. ; Macii, D. ; Moschitta, A. ; Carbone, P. ; Petri, D.

Author_Institution

Perugia Univ.

Volume

2

fYear

2005

fDate

16-19 May 2005

Firstpage

1027

Lastpage

1032

Abstract

This paper deals with a novel testing technique aimed at estimating the accuracy of analog-to-digital converters (ADC´s). Compared with other valuable research results, the main advantage of the proposed approach is the higher testing speed, i.e. the ability of achieving an accurate estimate of the low frequency component of an INL pattern in a shorter time than other standard techniques such as the sinewave histogram test (SHT). The performance of the whole procedure in terms of estimation accuracy has been determined theoretically and validated by means of both simulation and experimental results

Keywords

analogue-digital conversion; circuit simulation; circuit testing; nonlinear estimation; INL estimation; analog-to-digital converters; equivalent noise bandwidth; sinewave histogram test; AWGN; Analog-digital conversion; Bandwidth; Costs; Frequency estimation; Histograms; Manufacturing; Microcomputers; Parameter estimation; System testing; Analog-to-Digital Converters (ADCAs); INL estimation; Sinewave Histogram Test (SHT); equivalent noise bandwidth (ENBW);

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE

Conference_Location

Ottawa, Ont.

Print_ISBN

0-7803-8879-8

Type

conf

DOI

10.1109/IMTC.2005.1604296

Filename

1604296