Title :
Measured surface transfer impedance of multi-pin Micro-D Subminiature and LFHTM connector assemblies at frequencies up to 1 GHz
Author :
Hoeft, Lothar O. ; Knighten, James L. ; Ahmad, Munawar
Author_Institution :
Electromagn. Effects, Albuquerque, NM, USA
Abstract :
Candidate connector assemblies were examined for use in high-speed digital interconnects, such as the Fibre Channel protocol. Twelve Micro-D Subminiature connector pair and 6 Low Force Helix (LFHTM ) connector pair with EMI backshells were measured in a triaxial test fixture over 2 frequency ranges-a low frequency range of 1 kHz to 200 MHz and a high frequency range of 300 kHz to 3 GHz. A calibration sample of known impedance was used to correct the high frequency data to mitigate effects of the test fixture parasitics and permit credible transfer impedance data to be obtained up to 1 GHz. The Micro-D connector assemblies from two manufacturers, X and Y, were measured. There was no statistical difference between the Micro-D connector plugs assembled by manufacturers X and Y. At 200 MHz, the average transfer impedance of the Micro-D connectors was 35.4 mΩ. The sample-to-sample variation of the Micro-D connector pairs was minimal (standard deviation equaled 20% of average). The high frequency transfer impedance increased at a rate less than directly proportional to frequency suggesting that the coupling mechanism was not purely aperture coupling nor contact impedance. The transfer impedance (shielding performance) of the Micro-D connector was sensitive to tightness of the jack screws. The transfer impedance increased dramatically as jack screws were loosened and removed. The LFHTM connector exhibited transfer impedances approximately 15 dB lower than the Micro-D connector
Keywords :
calibration; electric connectors; electric impedance measurement; electromagnetic coupling; electromagnetic interference; electromagnetic shielding; protocols; 1 kHz to 200 MHz; 300 kHz to 3 GHz; 35.4 mohm; EMI backshells; Fibre Channel protocol; HF transfer impedance; LFH connector assemblies; Low Force Helix connector; Micro-D Subminiature connector; Micro-D connector plugs; aperture coupling; calibration samples; contact impedance; coupling mechanism; high frequency data correction; high frequency range; high-speed digital interconnects; jack screws; low frequency range; measured surface transfer impedance; multi-pin connector; shielding performance; test fixture parasitics; transfer impedance; transfer impedance data; triaxial test fixture; Assembly; Connectors; Fixtures; Force measurement; Frequency; Impedance measurement; Lifting equipment; Manufacturing; Surface impedance; Testing;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.810079