Title :
Thin-film poly-SI solar cells on AIT-textured glass - importance of the rear reflector
Author :
Widenborg, P.L. ; Chan, S. ; Walsh, T. ; Aberle, A.G.
Author_Institution :
ARC Photovoltaics Centre of Excellence, The University of New South Wales, UNSW Sydney NSW 2052, Australia
Abstract :
EQE measurements were performed on thin-film poly-Si solar cells fabricated by the solid phase crystallisation method of PECVD a-Si:H (PLASMA cells). PC1D simulation showed that a SiO2/aluminium rear reflector is superior to an aluminium reflector. A promising Jsc.EQE value of 23 mA/cm2 has been obtained for a 3 microns thick PLASMA poly-Si solar cell on Aluminium-Induced Texture (AIT) textured glass having a SiO2/aluminium rear reflector.
Keywords :
Aluminum; Crystallization; Glass; Performance evaluation; Phase measurement; Photovoltaic cells; Plasma measurements; Plasma simulation; Solids; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2008.4922509
