Analysis of the dendrite on printed wiring board by soft X-ray microscope and THz imaging: Structure of the dendrite in Ion-migration

Author

Mitobe, Kazutaka ; Suzuki, Masafumi ; Yoshimura, Noboru

Author_Institution

Dept. of EEE, Akita Univ., Akita, Japan

fYear

2011

fDate

22-24 Dec. 2011

Firstpage

1

Lastpage

4

Abstract

Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.

Keywords

X-ray microscopy; dendrites; electric fields; insulated wires; printed circuits; submillimetre wave imaging; terahertz wave imaging; terahertz waves; THz imaging system; THz wave; WDT method; acceleration testing; electrical field; electromagnetic wave; humid environment; insulated PWB; insulated printed wiring board; ion migration; ion-migration dendrite structure analysis; short circuit; soft X-ray microscope; visible light; water drop test method; Anodes; Cathodes; Electromagnetic scattering; Optical imaging; X-ray imaging; Dendrite; Electrochemical migration; Ion migration; THz imaging; X-ray;

fLanguage

English

Publisher

ieee

Conference_Titel

Power and Energy Systems (ICPS), 2011 International Conference on

Conference_Location

Chennai

Print_ISBN

INAVLID ISBN

Type

conf

DOI

10.1109/ICPES.2011.6156691

Filename

6156691