• DocumentCode
    3377678
  • Title

    GTEM radiated emissions correlation testing and FDTD modeling

  • Author

    Harrington, Timothy E. ; Chen, Zhong ; Foegelle, Michael D.

  • Author_Institution
    EMC Test Syst., Austin, TX, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    770
  • Abstract
    A three-dimensional finite-difference time-domain (FDTD) model is used to simulate basic GTEM to OATS and GTEM to free space radiated emissions correlation algorithms. The GTEM models are terminated both with the typical resistor/foam absorber load, or alternately with a numerical absorbing boundary condition to simulate a perfectly-matched load. Radiation from dipole and loop antennas and a 19" dummy EUT is simulated in FDTD GTEM, OATS, and free space models. Comparison is shown of simulated and measured data for these same antennas and EUT fed by a comb generator. Very good agreement is shown between the measured and computed results. Several considerations regarding correlation algorithm application in one-port TEM waveguides are discussed
  • Keywords
    antenna radiation patterns; correlation methods; dipole antennas; electromagnetic interference; electromagnetic wave absorption; electronic equipment testing; finite difference time-domain analysis; loop antennas; test facilities; waveguides; 3D FDTD model; EUT; FDTD GTEM; FDTD modeling; GTEM radiated emissions correlation testing; OATS; comb generator; dipole antenna radiation; dummy EUT; equipment under test; finite-difference time-domain; free space radiated emissions correlation algorithms; loop antenna radiation; measured data; numerical absorbing boundary condition; one-port TEM waveguides; perfectly-matched load; resistor/foam absorber load; simulated data; Antenna measurements; Computational modeling; Dipole antennas; Finite difference methods; Frequency; Open area test sites; Resistors; System testing; TEM cells; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-5057-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.1999.810116
  • Filename
    810116