• DocumentCode
    3377689
  • Title

    Size dependent nonuniformity loss in thin film photovoltaics

  • Author

    Muszynski, Timothy ; Shvydka, Diana ; Karpov, V.G.

  • Author_Institution
    Department of Physics and Astronomy, University of Toledo, OH 43606, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance. Fill factor is found to suffer the strongest nonuniformity loss most tightly correlated with efficiency; however, the effects of Voc and Jsc loss are significant as well. The observed size dependencies suggest a way of experimentally verifying the predicted effects, in particular, discriminating between them and the alternative ‘field-dependent collection’ explanation of the fill factor and efficiency loss. This discrimination is important, as leading to considerably different technological remedies.
  • Keywords
    Astronomy; Circuits; Diodes; Grain size; Immune system; Photovoltaic cells; Physics; SPICE; Thin film devices; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922536
  • Filename
    4922536