DocumentCode
3377690
Title
Complications in correlatability between test techniques due to directional emission patterns
Author
Johnson, D. Mark ; Hatfield, M.O. ; Slocum, Michael B. ; Freyer, Gustav J.
Author_Institution
Naval Surface Warfare Center, Dahlgren, VA, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
776
Abstract
Radiated emissions measurements are commonly performed in open area test sites (OATS), anechoic and semi-anechoic chambers, and GTEM and TEM cells. The OATS test results are typically regarded as the reference standard and all other techniques must be correlatable to the OATS data. The accepted procedures all determine the maximum emissions within some defined solid angle. Reverberation chambers, which measure total radiated power, are not currently accepted in any emission standard. Simple probing of general directional emission patterns can demonstrate what fraction of the total equipment-under-test (EUT) emissions are observed in a particular test technique. In this article, the emissions from two battery-powered laptop computers were investigated using a short wire antenna in the near field
Keywords
anechoic chambers (electromagnetic); computer testing; correlation methods; electric field measurement; electromagnetic interference; laptop computers; magnetic field measurement; measurement standards; test facilities; wire antennas; GTEM cells; OATS data; OATS test results; TEM cells; anechoic chambers; battery-powered laptop computers; directional emission patterns; emission standard; equipment under test; maximum emissions; near field; open area test sites; radiated emissions measurements; reference standard; reverberation chambers; semi-anechoic chambers; short wire antenna; solid angle; test techniques; total radiated power measurement; Area measurement; Current measurement; Measurement standards; Open area test sites; Performance evaluation; Power measurement; Reverberation chamber; Solids; TEM cells; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-5057-X
Type
conf
DOI
10.1109/ISEMC.1999.810117
Filename
810117
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